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From ORS 2016
Analytical Tools
White Light Interferometer (WLI: NewView 600, Zygo Corp)
The WLI is utilized in surface texture and metrology, providing us with resolution down to 1nm. ANSI (American National Standards Institute), ISO (International Standards Organization), JIS (Japanese Industry Standard) and many other international standards are upheld with our SWLI in surface texture parameters.
Coordinate Measuring Machine (CMM: Legex 322, Mitutoyo)
CMM is assisting in current breakthrough discoveries being made by orthopedic researchers. Our CMM provides detailed analysis of implant surfaces with resolution down to 0.8 um. Most importantly, these geometric changes can help indicate how much wear has taken place and where in the bearing it was located.
Scanning Electron Microscope (SEM: EVO MA15, Zeiss)
SEM allows for imaging from 50x to 20,000x magnification of a variety of materials. With a large motorized stage whole knee and hip implants can be imaged. Variable pressure also allows imaging of uncoated specimens. The SEM also has the ability for backscatter detection and has user friendly software to enhance your imaging.
Energy Dispersive Spectroscopy (EDS: Quantax 200, Bruker)
The EDS allows for elemental determination of samples and detection of potential contamination. The silicon drift detector and fast data acquisition enable an optimal reading to assess your sample.